Metrology Equipment(CD-SEM. FESEM, SEM, FIB)
Global Nanotech Equipment provides high qualitynew Material and Lab Equipment, used, 2nd hand, rebuilt and refurbished Metrology Equipment(CD-SEM. FESEM, SEM, FIB),Electronic Test Equipment and other semiconductor equipment ,quartz, ceramic,silicon carbide,silicon parts.
Our used Metrology Equipment is fully reconditioned to meet or exceed OEM specifications and carried out by our qualified engineers with many years of experience working for OEM.Combining more than 40 years of knowledge and experience in CD-SEM. FESEM, SEM, FIB, we refurbish many types of CD-SEM. FESEM, SEM, FIB used Metrology Equipment, including Refurbished Hitachi CD-SEM model S-8840, Hitachi CD-SEM model S-8820, Hitachi CD-SEM model S-9220, Hitachi CD-SEM model S-9260, Hitachi CD-SEM model S-9300, Hitachi FE-SEM model S-4500, Hitachi FE-SEM model S-4700, Hitachi FE-SEM model S-4160, Hitachi SEM S-2500ci, Hitachi SEM S-2300, Hitachi SEM S-2150, Hitachi SEM S800, Hitachi SEM S-570, JEOL JSM-840, LEO 1550 Field Emission SEM, LEO FE-SEM model 982, Micrion FIB model M9500 .We also provide new Energy Dispersive X- Ray Spectrometer QUANTAX 200 ,XFlash 5010 Detector combined with the used SEM for our valuable customers.
Global Nanotech Equipment also provides the following semiconductor equipment:
• Refurbished KLA 2135 Defect Inspection System;